Ex-situ TEM grids

Ex-situ grids enable each sample to be both TEM-imaged and characterized through electrical transport measurements.

The 3 mm grids are compatible with most TEM grid holders, making them useful for imaging by methods or microscopes that might be incompatible with specialized in-situ grids (often having dimensions that fit a single specialized holder).

Features:

  • Compatible with standard TEM holders
    • 3 mm diameter, 280 μm height
  • Four “device regions” having
    • Four electrode widths: 0.5, 1, 2, 4 μm* to fit a variety of sample sizes
    • Electrodes are gold
      • Low oxidation
      • 25 nm height provides a relatively flat surface (useful for 2D materials)
    • A thin ~20 nm nitride membrane for low-background imaging
    • Holes/slots for background-free imaging
    • Slots for imaging at high tilt angle
  • Bulk of the membrane is 140 nm for
    • Greater durability when depositing samples
    • Greater rigidity when imaging
  • No need for wire bonding or probe station*
    • 0.5 mm pad spacing* fits off-the-shelf FFC clamps (inquire for more info)
  • Optional custom lithography
    • 8 nearby electrodes to make contact to via local (e.g. e-beam) lithography
      • e.g. to add a top-gate
    • 4 alignment marks (240 μm spacing)
  • Unique device labels readable without a microscope

* exsitu-4e only